Quantum Modeling and Repairing Digital Systems
Електронного архіву Харківського національного університету радіоелектроніки (Open Access Repository of KHNURE)
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Quantum Modeling and Repairing Digital Systems
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| Creator |
Baghdadi, Ammar Awni Abbas
Hahanov, V. I. Palanichamy, Manikandan Litvinova, E. I. Dementiev, S. |
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| Subject |
Quantum Modeling
Repairing Digital Systems Digital System Qubit fault models |
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| Description |
The results of studies concerning the models and methods of quantum diagnosis of digital systems, qubit fault simulation and analysis of fault-free behavior, as well as repair of faulty primitives, are presented.A fault is defined as each individual discrepancy of a product to specification, but fault model should never lead out the product beyond the functionality limits. Therefore fault (fault model – failure) is time fixed part of the functionality that is tied to a physical component. The constant line fault is fixed transition 0- 0 at two adjacent cycles. It makes no sense to consider it as a further extension to other cycles, because according to the automaton model they are all described by means of two adjacent time frames. By extending this two-frame concept to automaton variables we can introduce the full set of fault transitions: 00, 01, 10, 11. Indeed, if we consider the automatic variables, for instance for the register, it is necessary to generate test patterns for verifying the above transitions. Based on the concept of the fault, it follows that the total number of states of functionality also forms a complete set of faults, with the only difference being that the specific fault is always a complement to test signal that detects a fault.
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| Date |
2016-09-02T11:14:20Z
2016-09-02T11:14:20Z 2013 |
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| Type |
Article
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| Identifier |
Litvinova E. I. Quantum Modeling and Repairing Digital Systems/Baghdadi Ammar Awni Abbas, Hahanov V. I., Palanichamy Manikandan, Litvinova E. I., Dementiev S.//Proceedings of IEEE East-West Design & Test Symposium (EWDTS’2013)
http://openarchive.nure.ua/handle/document/2006 |
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| Language |
en
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| Publisher |
EWDTS
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