Features of Decision Support’s Program at Choice of Tests Optimized Sequence for Semiconductors Memory Diagnosing
Електронного архіву Харківського національного університету радіоелектроніки (Open Access Repository of KHNURE)
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
Features of Decision Support’s Program at Choice of Tests Optimized Sequence for Semiconductors Memory Diagnosing
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| Creator |
Ryabtsev, V. G.
Almadi, M. K. |
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| Subject |
diagnosing
microcircuit memory |
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| Description |
A method, which allows decreasing calculations works labour intensiveness at the choice of paret-optimum tests for semiconductors storage devices diagnosing is offered. This method is realized in the program Optimal-test, which allows decreasing the duration of memory’s microcircuits testing without worsening of their quality.
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| Date |
2016-09-05T08:37:52Z
2016-09-05T08:37:52Z 2008 |
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| Type |
Article
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| Identifier |
http://openarchive.nure.ua/handle/document/2072
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| Language |
en
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| Publisher |
ХНУРЭ
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