A Low-Cost Optimal Time SIC Pair Generator
Електронного архіву Харківського національного університету радіоелектроніки (Open Access Repository of KHNURE)
Переглянути архів Інформація| Поле | Співвідношення | |
| Title |
A Low-Cost Optimal Time SIC Pair Generator
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| Creator |
Voyiatzis, I.
Efstathiou, C. Antonopoulou, H. |
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| Subject |
stuck-open testing
delay fault testing two-pattern testing built-in self test |
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| Description |
The application of Single Input Change (SIC) pairs of test patterns is very efficient for sequential, i.e. stuck-open and delay fault testing. In this paper a novel implementation for the application of SIC pairs is presented. The presented generator is optimal in time, in the sense that it generates the n-bit SIC pairs in time nu2n, i.e. equal to the theoretical minimum. Comparisons with the schemes that have been proposed in the open literature which generate SIC pairs in optimal time reveal that the proposed scheme requires less hardware overhead
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| Date |
2016-09-06T10:31:47Z
2016-09-06T10:31:47Z 2010 |
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| Type |
Article
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| Identifier |
Voyiatzis, I. A Low-Cost Optimal Time SIC Pair Generator / I. Voyiatzis, H. Antonopoulou, C. Efstathiou // Радиоэлектроника и информатика : науч.-техн. журн. – Х. : Изд-во ХНУРЭ, 2010. – Вып. 4. – С. 21-26.
http://openarchive.nure.ua/handle/document/2144 |
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| Language |
en
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| Publisher |
ХНУРЭ
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